2010

Synthesis, characterization, and photoactivity of InTaO4InTaO4 and In0.9Ni0.1TaO4In0.9Ni0.1TaO4 thin films prepared by electron evaporation

V.J. Rico, F. Frutos, F. Yubero, J.P. Espinós, A.R. González-Elipe
Journal of Vacuum Science and Technology A, 28 (2010) 127-134
doi: 10.1116/1.3273597

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Morphological evolution of pulsed laser deposited ZrO2 thin films

R. Álvarez, A. Palmero, L.O. Prieto-López, F. Yubero, J. Cotrino, W. de la Cruz, H. Rudolph, F.H.P.M. Habraken, A.R. González-Elipe
Journal of Applied Physics, 107 (2010) 054311 (10)
doi: 10.1063/1.3318604

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Non-destructive depth compositional profiles by XPS peak-shape analysis

M.C. López-Santos, F. Yubero, J.P. Espinós, A.R. González-Elipe
Analytical and Bioanalytical Chemistry, 396 (2010) 2757-2768
doi: 10.1007/s00216-009-3312-9

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2009

Surface nanostructuring of TiO2 thin films by ion beam irradiation

P. Romero-Gómez, A. Palmero, F. Yubero, M. Vinnichenko, A. Kolitsch, A.R. González-Elipe
Scripta Materialia, 60 (2009) 574-577
doi: 10.1016/j.scriptamat.2008.12.014

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Wetting Angles on Illuminated Ta2O5 Thin Films with Controlled Nanostructure

V.J. Rico, A. Borrás, F. Yubero, J.P. Espinós, F. Frutos, A.R. González-Elipe
Journal of Physical Chemistry C, 113 (2009) 3775-3784
doi: 10.1021/jp805708w

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Electrical characteristics of mixed Zr–Si oxide thin films prepared by ion beam induced chemical vapor deposition at room temperature

F.J. Ferrer, F. Frutos, J. García-López, C. Jiménez, F. Yubero
Thin Solid Films, 517 (2009) 5446-5452
doi: 10.1016/j.tsf.2009.01.099

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Identification of hydrogen and deuterium at the surface of water ice by reflection electron energy loss spectroscopy

F. Yubero, K. Tokési
Applied Physics Letters, 95 (2009) 084101 (3)
doi: 10.1063/1.3202402

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Formation of Nitrogen Functional Groups on Plasma Treated DLC

C. López-Santos, F. Yubero, J. Cotrino, L. Contreras, A. Barranco, A.R. González-Elipe
Plasma Processes and Polymers, 6 (2009) 555-565
doi: 10.1002/ppap.200900019

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2008

Interface effects in the Ni2p x-ray photoelectron spectra of NiO thin films grown on oxide substrates

I. Preda, A. Gutiérrez, M. Abbate, F. Yubero, J. Méndez, L. Alvarez, L. Soriano
Physical Review B, 77 (2008) 075411 (1-7)
doi: 10.1103/PhysRevB.77.075411

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Test of validity of the V-type approach for electron trajectories in reflection electron energy loss spectroscopy

F. Yubero, N. Pauli, A. Dubus, S. Tougaard
Physical Review B, 77 (2008) 245405 (11)
doi: 10.1103/PhysRevB.77.245405

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