Positron annihilation analysis of nanopores and growth mechanism of oblique angle evaporated TiO2 and SiO2 thin films and multilayers
García-Valenzuela, A., Butterling, M., Liedke, M.O., Hirschmann, E., Trinh, T.T., Attallah, A.G., Wagner, A., Alvarez, R., Gil-Rostra, J., Rico, V., Palmero, A., González-Elipe, A.R.
Microporous and Mesoporous Materials, 295 (2020) 109968
2012
Critical thickness and nanoporosity of TiO2 optical thin films
A. Borrás, R. Alvarez, J.R. Sánchez-Valencia, J. Ferrer, A.R. González-Elipe
Microporous and Mesoporous Materials, 160 (2012) 1-9
doi: 10.1016/j.micromeso.2012.04.035
2009
Porosity and microstructure of plasma deposited TiO2 thin films
A. Borrás, J.R. Sánchez-Valencia, J. Garrido-Molinero, A. Barranco, A.R. González-Elipe
Microporous and Mesoporous Materials, 118 (2009) 314-324
doi: 10.1016/j.micromeso.2008.09.002