Non-destructive depth compositional profiles by XPS peak-shape analysis
M.C. López-Santos, F. Yubero, J.P. Espinós, A.R. González-Elipe
Analytical and Bioanalytical Chemistry, 396 (2010) 2757-2768
doi: 10.1007/s00216-009-3312-9
Nanotechnology on Surfaces and Plasma
Research Group on Thin Films Engineering and Plasma Technology
