2019

XPS primary excitation spectra of Zn 2p, Fe 2p, and Ce 3d from ZnO, α-Fe2O3 , and CeO2

Pauly, N., Yubero, F., Espinós, J.P., Tougaard, S.

Surface and Interface Analysis, 51 (2019) 353-360

DOI: 10.1002/sia.6587

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2015

Effect of magnesium and titanium on the cathodic behaviour of aluminium in nitric acid

F.J. García-García, T.Y. Chiu, P. Skeldon, G. E. Thompson
Surface and Interface Analysis, 47 (2015) 30-36
doi: 10.1002/sia.5640

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2014

Study of the early stages of growth of Co oxides on oxide substrates

D. Díaz-Fernández, J. Méndez, F. Yubero, G. Domínguez-Cañizares, A. Gutiérrez, L. Soriano
Surface and Interface Analysis, 46 (2014) 975-979
doi: 10.1002/sia.5366

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Modeling of X-ray photoelectron spectra: surface and core hole effects

N. Pauly, F. Yubero, S. Tougaard
Surface and Interface Analysis, 46 (2014) 920-923
doi: 10.1002/sia.5372

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Interpretation of electron Rutherford backscattering spectrometry for hydrogen quantification

R. Alvarez, F. Yubero
Surface and Interface Analysis, 46 (2014) 812-816
doi: 10.1002/sia.5486

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2012

Software package to calculate the effects of the core hole and surface excitations on XPS and AES

S. Tougaard, F. Yubero
Surface and Interface Analysis, 44 (2012) 1114-1118
doi: 10.1002/sia.4855

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2010

Study of the morphology of NiO nanostructures grown on highly ordered pyrolytic graphite, by the Tougaard method and atomic force microscopy: a comparative study

I. Preda, L. Soriano, L. Alvarez, J. Méndez, F. Yubero, A. Gutiérrez, J.M. Sanz
Surface and Interface Analysis, 42 (2010) 869-873
doi: 10.1002/sia.3222

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2007

Study of the first nucleation steps of thin films by XPS inelastic peak shape analysis

C. Mansilla, F. Gracia, A.I. Martin-Concepción, J.P. Espinós, J.P. Holgado, F. Yubero, A.R. González-Elipe
Surface and Interface Analysis, 39 (2007) 331-336
doi: 10.1002/sia.2509

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Electron inelastic mean free paths: influence of the modelling energy-loss function

W. de la Cruz, F. Yubero
Surface and Interface Analysis, 39 (2007) 460-463
doi: 10.1002/sia.2545

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2006

Theoretical determination of the surface excitation parameter from X-ray photoelectron spectroscopy

N. Pauly, S. Tougaard, F. Yubero
Surface and Interface Analysis, 38 (2006) 872-875
doi: 10.1002/sia.2173

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