Differences in n-type doping efficiency between Al- and Ga-ZnO films
M. Gabás, A. Landa-Cánovas, J.L. Costa-Krämer, F. Agulló-Rueda, A.R. González-Elipe, P. Díaz-Carrasco, J. Hernández-Moro, I. Lorite, P. Herrero, P. Castillero, A. Barranco, J.R. Ramos-Barrado
Journal of Applied Physics, 113 (2013) 163709 (10pp)
doi: 10.1063/1.4803063
2012
Influence of plasma-generated negative oxygen ion impingement on magnetron sputtered amorphous SiO2 thin films during growth at low temperatures
M. Macias-Montero, F.J. Garcia-Garcia, R. Álvarez, J. Gil-Rostra, J.C. González, J. Cotrino, A.R. Gonzalez-Elipe, A. Palmero
Journal of Applied Physics, 111 (2012) 054312
doi: 10.1063/1.3691950
2010
On the microstructure of thin films grown by an isotropically directed deposition flux
R. Alvarez, P. Romero-Gómez, J. Gil-Rostra, J. Cotrino, F. Yubero, A. Palmero, A.R. González-Elipe
Journal of Applied Physics, 108 (2010) 064316 (7)
doi: 10.1063/1.3483242
Morphological evolution of pulsed laser deposited ZrO2 thin films
R. Álvarez, A. Palmero, L.O. Prieto-López, F. Yubero, J. Cotrino, W. de la Cruz, H. Rudolph, F.H.P.M. Habraken, A.R. González-Elipe
Journal of Applied Physics, 107 (2010) 054311 (10)
doi: 10.1063/1.3318604
2008
Influence of the chemical and electronic structure on the electrical behavior of zirconium oxynitride films
P. Carvalho, J.M. Chappé, L. Cunha, S. Lanceros-Méndez, P. Alpuim, F. Vaz, E. Alves, C. Rousselot, J.P. Espinós, A.R. González-Elipe
Journal of Applied Physics, 103 (2008) 104907 (1-15)
doi: 10.1063/1.2927494
2007
Size and shape of supported zirconia nanoparticles determined by x-ray photoelectron spectroscopy
F. Yubero, C. Mansilla, F.J. Ferrer, J.P. Holgado, A.R. González-Elipe
Journal of Applied Physics, 101 (2007) 124910 (1-6)
doi: 10.1063/1.2749482
Microscopic and macroscopic dielectric description of mixed oxide thin films
F.J. Ferrer, F. Yubero, J.A. Mejías, F.J. García-López, A.R. González-Elipe
Journal of Applied Physics, 102 (2007) 084112 (1-7)
doi: 10.1063/1.2801402
2006
Measuring the electron temperature by optical emission spectroscopy in two temperature plasmas at atmospheric pressure: A critical approach
A. Barranco, A. Yanguas-Gil, F. Yubero, A.R. González-Elipe
Journal of Applied Physics, 99 (2006) 033104 (1-6)
doi: 10.1063/1.2170416
Analysis of SiOxCyHzSiOxCyHz polymeric materials by x-ray absorption spectroscopy: Anomalous behavior of the resonant SiKLLSiKLL Auger spectra
A. Barranco, A. Yanguas-Gil, F. Yubero, A.R. González-Elipe
Journal of Applied Physics, 100 (2006) 033706 (1-7)
doi: 10.1063/1.2222043