Roughness assessment and wetting behavior of fluorocarbon surfaces
A. Terriza, R. Álvarez, A. Borrás, J. Cotrino, F. Yubero, A.R. González-Elipe
Journal of Colloid and Interface Science, 376 (2012) 274–282
doi: 10.1016/j.jcis.2012.03.010
Software package to calculate the effects of the core hole and surface excitations on XPS and AES
S. Tougaard, F. Yubero
Surface and Interface Analysis, 44 (2012) 1114-1118
doi: 10.1002/sia.4855
Electrochromic Behavior of W(x)Si(y)O(z) Thin Films Prepared by Reactive Magnetron Sputtering at Normal and Glancing Angles
J. Gil-Rostra, M. Cano, J.M. Pedrosa, F.J. Ferrer, F.J. García-García, F. Yubero, A.R. González-Elipe
ACS Applied Materials and Interfaces, 4 (2012) 628-638
doi: 10.1021/am2014629
Attenuation lengths of high energy photoelectrons in compact and mesoporous SiO2 films
F.J. Ferrer, J. Gil-Rostra, L. González-García, J. Rubio-Zuazo, P. Romero-Gómez, M.C. López-Santos, F. Yubero
Surface Science, 606 (2012) 820-824
doi: 10.1016/j.susc.2012.01.017
Influence of plasma-generated negative oxygen ion impingement on magnetron sputtered amorphous SiO2 thin films during growth at low temperatures
M. Macias-Montero, F.J. Garcia-Garcia, R. Álvarez, J. Gil-Rostra, J.C. González, J. Cotrino, A.R. Gonzalez-Elipe, A. Palmero
Journal of Applied Physics, 111 (2012) 054312
doi: 10.1063/1.3691950
Quantification of low levels of fluorine content in thin films
F.J. Ferrer, J. Gil-Rostra, A. Terriza, G. Rey, C. Jiménez, J. García-López, F. Yubero
Nuclear Instruments and Methods in Physics Research B, 274 (2012) 65-69
doi: 10.1016/j.nimb.2011.11.042
Analysis of multifunctional titanium oxycarbide films as a function of oxygen addition
J.M. Chappé, A.C. Fernandes, C. Moura, E. Alves, N. P. Barradas, N. Martin, J.P. Espinós, F. Vaz
Surface and Coatings Technology, 206 (2012) 2525-2534
doi: 10.1016/j.surfcoat.2011.11.005
Superhydrophobic supported Ag-NPs@ZnO-nanorods with photoactivity in the visible range
M. Macías-Montero, A. Borrás, Z. Saghi, P. Romero-Gómez, J.R. Sánchez-Valencia, J.C. González, A. Barranco, P. Midgley, J. Cotrino, A.R. González-Elipe
Journal of Materials Chemistry, 22 (2012) 1341-1346
doi: 10.1039/C1JM13512K