Study of the first nucleation steps of thin films by XPS inelastic peak shape analysis

C. Mansilla, F. Gracia, A.I. Martin-Concepción, J.P. Espinós, J.P. Holgado, F. Yubero, A.R. González-Elipe
Surface and Interface Analysis, 39 (2007) 331-336
doi: 10.1002/sia.2509

Read the rest of this entry »


SiO2/TiO2 thin films with variable refractive index prepared by ion beam induced and plasma enhanced chemical vapor deposition

F. Gracia, F. Yubero, J.P. Holgado, J.P. Espinós, A.R. González-Elipe, T. Girardeau
Thin Solid Films, 500 (2006) 19-26
doi: 10.1016/j.tsf.2005.10.061

Read the rest of this entry »

Analysis of texture and microstructure of anatase thin films by Fourier transform infrared spectroscopy

M. Ocaña, C. Pecharromán, F. Gracia, J.P. Holgado, A.R. González-Elipe
Thin Solid Films, 515 (2006) 1585-1591
doi: 10.1016/j.tsf.2006.05.022

Read the rest of this entry »

Correlation between optical properties and electronic parameters for mixed oxide thin films

F. Gracia, F. Yubero, J.P. Espinós, J.P. Holgado, A.R. González-Elipe, T. Girardeau
Surface and Interface Analysis, 38 (2006) 752-756 (2006)
doi: 10.1002/sia.2273

Read the rest of this entry »