Optical refractive index and static permittivity of mixed Zr–Si oxide thin films prepared by ion beam induced CVD
F.J. Ferrer, F. Frutos, F.J. García-López, A.R. González-Elipe, F. Yubero
Thin Solid Films, 516 (2007) 481-485
doi: 10.1016/j.tsf.2007.07.139
Microscopic and macroscopic dielectric description of mixed oxide thin films
F.J. Ferrer, F. Yubero, J.A. Mejías, F.J. García-López, A.R. González-Elipe
Journal of Applied Physics, 102 (2007) 084112 (1-7)
doi: 10.1063/1.2801402
Relationship between scaling behavior and porosity of plasma-deposited TiO2 thin films
A. Borrás, A. Yanguas-Gil, A. Barranco, J. Cotrino, A.R. González-Elipe
Physical Review B, 76 (2007) 235303 (1-8)
doi: 10.1103/PhysRevB.76.235303