F. Yubero, S. Tougaard
Journal of Electron Spectroscopy and Related Phenomena, 185 (2012) 552–558
doi: 10.1016/j.elspec.2012.11.011

This is a study on the validity of the previously published semi-classical dielectric response model description of the electron energy losses observed in X-ray photoelectron emission [A. Cohen Simonsen, et al., Phys. Rev. B 56 (1997) 1612]. In particular, we study the loss structure corresponding to Cu 2p and Fe 2p photoelectron emission from pure copper and iron samples for several emission angles. We have chosen these core level emissions because they have different natural width and asymmetrical line shape. It is found that both the total intensity below the main photon excited peaks and the dependence of particular surface loss structures (with respect to both shape and intensity) with the angle of emission is well reproduced by the dielectric model.

Dielectric description of the angular dependence of the loss structure in core level photoemission