I. Blaszczyk-Lezak, F.J. Aparicio, A. Borrás, A. Barranco, A. Alvarez-Herrero, M. Fernández-Rodríguez, A.R. González-Elipe
Journal of Physical Chemistry C, 113 (2009) 431-438
doi: 10.1021/jp807634j

This work reports about the preparation of plasma polymerized thin films of perylene with thicknesses ∼30−150 nm and their characterization by different methods and the analysis of their optical properties. Highly absorbent and fluorescent films have been obtained by this method that combines the sublimation of the perylene molecules and their controlled polymerization by the interaction with remote Ar plasma. The polymeric films are very flat with a root mean square (rms) roughness in the range 0.3−0.4 nm. In contrast with the sublimated layers of perylene that present a high scattering of light, the polymerized films depict the well-defined absorption bands in the region 400−450 nm and fluorescence spectra of the perylene molecule at ∼475 nm. The films are formed by a matrix formed by cross-linked fragments of perylene and intact molecules that confer the observed optical properties to this material. The optical and microstructural characteristics of this type of thin films and the possibility to perform their deposition by using lithographic procedures make them suitable for their integration into photonic components for various applications. A preliminary study of the use of these films as an optical sensor of NO₂ is also presented.