García-Valenzuela, A., Alvarez, R., Rico, V., Espinos, J.P., López-Santos, M.C., Solís, J., Siegel, J., del Campo, A., Palmero, A., González-Elipe, A.R.

Applied Surface Science, 480 (2019) 115-121

DOI: 10.1016/j.apsusc.2019.02.206

Unlike topography patterning, widely used for numerous applications and produced by means of different technologies, there are no simple procedures to achieve surface compositional patterning at nanometric scales. In this work we have developed a simple method for 2D patterning the composition of thin films. The method relies on the magnetron sputtering deposition at oblique angles onto patterned substrates made by laser induced periodic surface structures (LIPSS). The method feasibility has been demonstrated by depositing SiOx thin films onto LIPSS structures generated in Cr layers. A heterogeneous and aligned distribution of O/Si ratios (and different Si n+ chemical states) along the LIPSS structure in length scales of some hundreds nm’s has been proven by angle resolved X-ray photoelectron spectroscopy and a patterned arrangement of composition monitored by atomic force microscopy-Raman analysis. The obtained results are explained by the predictions of a Monte Carlo simulation of this deposition process and open the way for the tailored one-step fabrication of surface devices with patterned compositions.